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⋄ Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

L. Wang, S. Guillemin, J.M. Chauveau, V. Sallet, F. Jomard, R. Brenier, V. Consonni, G. Brémond
Phys. Stat. Sol. C, 13, 576, (2016)
Abstract online (HAL) : click here...