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⋄ Stress and doping analysis of low n-doped GaN layers on various substrates by micro-Raman mapping

Ndembi Ignoumba-Ignoumba, Camille Sonneville, Thomas Kaltsounis, Vishwajeet Maurya, Hala El Rammouz, Mohammed El Amrani, Maroun Dagher, Florian Bartoli, Thibaud Guillemin, Adrien Bidaud, Eric Frayssinet, Farid Medjdoub, Hassan Maher, Jean Marie Bluet, Dominique Planson, Julien Buckley, Yvon Cordier, Matthew Charles, and Cyril Buttay
Appl. Phys. Lett., 128, 123306, (2026)
Abstract online (HAL) : click here...

⋄ Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

L. Wang, S. Guillemin, J.M. Chauveau, V. Sallet, F. Jomard, R. Brenier, V. Consonni, G. Brémond
Phys. Stat. Sol. C, 13, 576, (2016)
Abstract online (HAL) : click here...