The characterization resources managed and operated by the CAT division are grouped together within the Advanced Materials Characterization Platform, CRHEACAM. The CRHEACAM platform's resources are available to CRHEA research teams and external academic laboratories. The platform also offers services to external academic laboratories and companies.
The CRHEACAM platform has the following characterization resources:
- scanning electron microscopy (SEM),
- transmission electron microscopy (TEM),
- atomic force microscopy (AFM),
- x-ray diffraction (XRD),
- photoluminescence (PL),
- cathodoluminescence (CL).
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Contact the laboratory
- Laboratory reception : Anne-Marie Cornuet
- Phone : +33 4 93 95 42 00
- Webmaster
